Exploring Microstructures: Scanning Electron Microscopy and X-Ray Microanalysis

“Exploring Microstructures: Scanning Electron Microscopy and X-Ray Microanalysis” is a comprehensive textbook that delves into the intricacies of microstructure analysis using advanced techniques like Scanning Electron Microscopy (SEM) and X-Ray Microanalysis. Covering a broad spectrum of topics, from EBSD (Electron backscatter diffraction) and ion beam microanalysis to variable pressure SEM and environmental SEM, the book serves as an invaluable resource for researchers, students, and practitioners in the field. With a focus on practical applications, the text explores qualitative and quantitative X-ray analysis, X-ray mapping, and the use of SDD x-ray detectors, offering a detailed understanding of microstructural characterization methods.

This textbook is not only a guide to SEM but also covers dual-column instruments, Focused Ion Beam (FIB), and table-top SEM, providing a comprehensive view of the latest tools and techniques in microstructural analysis. Whether exploring biological microscopy or delving into X-ray spectral measurement, this book caters to a diverse audience, making it an essential reference for those engaged in the exploration of microstructures across various scientific disciplines.

Keywords

EBSD, Electron backscatter diffraction, Environmental SEM, Focused ion beam, Ion beam microanalysis, Qualitative X-ray analysis, Quantitative X-ray analysis, SDD x-ray detectors, SEM textbook, Table top SEM, Variable pressure SEM, X-ray mapping, X-ray microanalysis book, X-ray spectral measurement, dual column instruments, Biological Microscopy